In particular, a guide is written for designers who may want to use ISO 10110 but are unsure of where to begin or for anybody who may need a lens fabricated but is not necessarily familiar with the details of optical fabrication. The real problem seems to be the lack of a ‘simple, practical’ guide for generating an ISO drawing. This is not particularly the designer’s fault. In talking to vendors and fellow designers about the issue, it became obvious to me that most errors arise from a designer’s or a design team’s unfamiliarity with the standard and how to implement it. Although the ISO 10110 optical drawing standard has begun to see widespread use in the optical industry, an optical shop will often receive an ISO 10110 drawing that is incomplete or incorrectly implemented. In optical system, the scattered light beam can be absorbed by other elements, which may over the threshold of elements material and cause serious damage to the system.įor surface defect standards, LPO normally use ISO10110, MIL-13830 and Din 3140.The ISO 10110 standard is an optical drawing standard used to explicitly describe an optical part based on the principle of geometric dimensioning and tolerancing (GD&T). The defect area is easy to absorb more energy, the thermal effect phenomenon may cause local deformation of the element, damage the coating layer, ect. The defect area may cause light beam scatter, the energy of beam is greatly consumed after passing through the defect. Surfact defects can hardly affect the optical system and damage other optical elements. In Din3140 standard, use "C" indicate coating defects or other contaminants. In general, they can not remove by air bubble, alcohol or acetone. It means small dirts, coating spots, splash point and so on. In Din3140 standard, use "R" indicate edge chips. In ISO standard, EA''' means edge chip requirement.Į is the header for edge chip, A''' is the maximum chip size from the physical edge of the surface in mm. It is a defects on the edge of optical elements, it's often outside the effective area of the light source, but may also cause light scattering, cause cosmetic and functional concerns. While in Din 3140 standard, use "K" indicate scratch. N is number of digs at maximun size, A is the maximum size of each digs in mm. In ISO standard, N x A means dig requirement. In general, a defect with an aspect ratio greater than 4:1 is scratched, whereas a defect less than 4:1 is a dig. Digs, pits, eched pits, are often interpreted in linear dimesion by its diameter with unit of 1/100 mm.ĭigs have close width and depth, and the edges are often irregular.
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